The 14th international "Hiroshima" Symposium on the Development and Application of Semiconductor Tracking Detectors (HSTD 14)

Recent application studies of INTPIX4NA SOIPIX detector based X-ray camera using SiTCP-XG 10GbE based high-speed readout system at KEK facilities

16 Nov 2025, 10:50

10m

2F, Activities Center (Academia Sinica)

POSTER Pixel and Strip Sensors ALL Poster

Speaker

Ryutaro Nishimura (Photon Factory, Institute of Materials Structure Science, High Energy Accelerator Research Organization)

Description

The SOIPIX (Silicon-On-Insulator PIXel) detector is a unique monolithic structure imaging device under development by the SOIPIX group, led by the High Energy Accelerator Research Organization (KEK).
We, the detector team at the KEK Photon Factory (PF), have developed an X-ray camera [1] using the INTPIX4NA SOIPIX detector [2].
The INTPIX4NA has a sensitive area of 14.1 x 8.7 mm^2, with 425,984 pixels arranged in an 832-column × 512-row matrix, and a pixel size of 17 x 17 um^2.
This detector provides high resolution and excellent sensitivity for low-intensity X-rays.
The readout system used in the X-ray camera was also developed at PF.
It is equipped with SiTCP-XG, a network controller implemented on an FPGA, which supports 10 Gbps Ethernet to enable high-frame-rate imaging at several hundred hertz.
We are currently investigating the application of this X-ray camera in several experiments at KEK.
In this report, we present some of these studies:
(1) Application to the optics of an X-ray zooming microscope using two Fresnel zone plates (FZPs) [3] at PF AR-NE1A.
(2) Application to a phase-contrast X-ray imaging system using a two-crystal X-ray interferometer [4] at PF BL-14C.
(3) Application to non-destructive detection of lithium in Li-ion battery electrode materials using muonic X-rays [5] at J-PARC MLF Muon D2.

[1] R. Nishimura, N. Igarashi, D. Wakabayashi, Y. Suzuki, K. Hirano and Y. Arai, X-ray imaging camera using INTPIX4NA SOIPIX detector with SiTCP-XG 10GbE based high-speed readout system, Nucl. Instrum. Methods Phys. Res. A, 1064, 169429, (2024).
[2] R. Nishimura, S. Kishimoto, T. Sasaki, S. Mitsui, M. Shinya, Y. Arai and T. Miyoshi, "INTPIX4NA" — new integration-type silicon-on-insulator pixel detector for imaging application, J. Instrum., 16, P08054, (2021).
[3] D. Wakabayashi, Y. Suzuki, Y. Shibazaki, H. Sugiyama, K. Hirano, R. Nishimura, K. Hyodo, N. Igarashi and N. Funamori, X-ray zooming microscopy with two Fresnel zone plates, Rev. Sci. Instrum., 93, 033701, (2022).
[4] A. Yoneyama, D. Takamatsu, T.-T. Lwin, S. Yamada, T. Takakuwa, K. Hyodo, K. Hirano, S. Takeya, Crystal-Based X-ray Interferometry and Its Application to Phase-Contrast X-ray Imaging, Zeff Imaging, and X-ray Thermography. Appl. Sci., 13(9), 5424, (2023).
[5] I. Umegaki, Y. Higuchi, Y. Kondo, K. Ninomiya, S. Takeshita, M. Tampo, H. Nakano, H. Oka, J. Sugiyama, M. K. Kubo and Y. Miyake, Nondestructive High-Sensitivity Detections of Metallic Lithium Deposited on a Battery Anode Using Muonic X-rays, Anal. Chem., 92, 12, 8194−8200, (2020).