Design and Performance Evaluation of a Filter-Free Dual-Layer Flat Panel Detector Using Monte-Carlo simulation

16 Nov 2025, 13:30
10m
2F, Activities Center (Academia Sinica)

2F, Activities Center

Academia Sinica

128 Section 2, Academia Road, Nankang, Taipei 115201, Taiwan
POSTER Detector Concepts, Simulations ALL Poster

Speaker

Jiyong Shim

Description

Dual-energy X-ray imaging utilizing a dual-layer flat panel detector (DE-FPD) is widely used in radiography and computed tomography. A conventional DE-FPD is composed of a top layer featuring a 200 μm-thick cesium iodide scintillator and a bottom layer with a 600 μm-thick scintillator, both connected to an identical amorphous silicon thin-film transistor array. These layers are separated by a 1 mm-thick copper (Cu) filter, which enhances spectral separation to improve dual-energy images. However, the Cu filter reduces the number of entrance photons reaching the bottom layer, significantly diminishing the quality of selective dual-energy images. This study introduces a filter-free DE-FPD design, incorporating a thicker (500 μm-thick) top layer scintillator, and evaluates the detector's performance using Geant4 Monte Carlo simulation. The performance was assessed by measuring the modulation transfer function, noise power spectrum, and noise-equivalent quanta for both the top and bottom layers under RQA5 and RQA7 X-ray beam quality. Our preliminary findings suggest that the proposed DE-FPD exhibits improved detector performance compared to the conventional model. More systematic and quantitative simulation results will be presented in the paper.

Author

Co-authors

Dr Bo Kyung Cha (Korea Electrotechnology Research Institute) Hyosung Cho (Yonsei university)

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