Analysis of unstable leakage current in ATLAS18 Strip Sensors after long-term tests

16 Nov 2025, 14:30
10m
2F, Activities Center (Academia Sinica)

2F, Activities Center

Academia Sinica

128 Section 2, Academia Road, Nankang, Taipei 115201, Taiwan
POSTER Pixel and Strip Sensors ALL Poster

Speaker

Christoph Klein (Carleton University)

Description

With the upgrade of the LHC to the High-Luminosity LHC (HL-LHC), the Inner Detector will be replaced with the new all-silicon ATLAS Inner Tracker (ITk) to maintain tracking performance in a high-occupancy environment and to cope with the increase in the integrated radiation dose.

Comprising an active area of 165m$^2$, the outer four layers in the barrel and six disks in the endcap region will host strip modules, built with single-sided micro-strip sensors and glued-on hybrids carrying the front-end electronics necessary for readout. Before being shipped out for module building, a total of 24010 ATLAS18 n$^+$-in-p strip sensors, of which 17888 sensors are to be installed in the experiment, were tested at different institutes in the collaboration for mechanical and electrical compliance with technical specifications, the quality control (QC), while technological parameters were verified on test structures from the same wafers before and after irradiation, the quality assurance (QA).

Reverse bias leakage current characteristics of every single sensor and leakage current stability measurements on a sample basis are an important part of QC procedure. During these measurements, a recurring pattern of performance degradation and recovery in leakage current and sensor breakdown after long-term testing has been observed for a subset of sensors. A comprehensive analysis of those changes observed during Sensor QC will be shown. Mitigation and recovery procedures, such as ionizing guns, exposure to UV light and sensor baking, developed by the sensor community and applied at different QC sites will also be highlighted, including their impact on sensor performance.

Author

Christoph Klein (Carleton University)

Co-authors

Jeff Dandoy (Carleton University) John Keller (Carleton University) Ezekiel Staats (Carleton University) Callan Jessiman (Carleton University) Thomas Koffas (Carleton University) Yuzhan Zhao (Carleton University) Javier Fernandez-Tejero (Institut de Microelectrònica de Barcelona (IMB-CNM, CSIC)) Quinn Fryman Paddock (University of California, Santa Cruz) Sefi Katznelson (University of California, Santa Cruz) George Martinez-Mckinney (University of California, Santa Cruz) Kirsten Affolder (University of California, Santa Cruz) Tony Affolder (University of California, Santa Cruz) Len Morelos-Zaragoza (University of California,Santa Cruz) Pavla Federicova Marcela Mikestikova Jiri Kroll (Institute of Physics of the Czech Academy of Sciences) Jana Kozakova (Institute of Physics, Czech Academy of Sciences) Magdalena Kutova (Institute of Physics of the Czech Academy of Sciences) Vitaly Fadeyev (University of California, Santa Cruz) Yoshinobu Unno (KEK) Miguel Ullan (Centro Nacional de Microelectronica (IMB-CNM, CSIC))

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