Speaker
Description
This study presents a novel method to suppress wrapround artifacts in single grating X-ray dark-field imaging (SG-XDFI). SG-XDFI is an emerging technology that can be used to detect small-angle X-ray scattering signals from sample inhomogeneities at the microscale and nanoscale using the spatial harmonic imaging technique. However, when a sample has strong high-frequency components and/or the grating frequency is low, the dark-field image is distorted by spectral overlap-induced aliasing artifacts. Therefore, aliasing artifacts should be suppressed to ensure high-quality dark-field images. In the proposed method, aliasing artifacts are suppressed by generating an artifact map and subsequently subtracting it from the original (i.e., artifact-contaminated) dark-field image, yielding an artifact-free dark-field image. To verify the efficacy of the proposed method, we performed an experiment on a printed circuit board and investigated the image quality. According to our preliminary results, the proposed method effectively suppressed the wraparound artifacts in SG-XDFI, significantly enhancing the image quality.
