Simulation of the Electrical Performance of the ITk ATLAS18 Test Diode and Strip Main Sensors Before and After Irradiation

16 Nov 2025, 14:40
10m
2F, Activities Center (Academia Sinica)

2F, Activities Center

Academia Sinica

128 Section 2, Academia Road, Nankang, Taipei 115201, Taiwan
POSTER Pixel and Strip Sensors ALL Poster

Speaker

Yuzhan Zhao (Carleton University)

Description

The ATLAS experiment will be replacing the current inner detector with the Inner Tracker (ITk) to accommodate the increased occupancy and radiation levels anticipated at the High-Luminosity LHC (HL-LHC). The ITk system consists of silicon-based pixel and strip sub-detectors. The strip detectors, fabricated by Hamamatsu Photonics, are based on an n⁺-in-p design with a 75 μm strip pitch and a 300 μm active thickness, and are expected to operate up to a fluence of 1.6x10¹⁵ 1-MeV neq/cm².

To better understand the fundamental behavior of the strip sensors and to guide their operation, we have developed a 2D Sentaurus TCAD model, tuned using optical and electrical characterization data from the test diodes fabricated on the same wafer as well as the main strip sensors. The simulation incorporates material defect models material defects measured from deep-level transient spectroscopy (DLTS), along with a dedicated interface model for the oxide layer in the peripheral region to improve agreement with laboratory measurements. By extending this model to the ITk main strip sensors, the simulations show good agreement with the extensive Quality Control data collected during sensor reception acceptance measurements. Finally, using this updated TCAD model as a starting point, we simulate device performance at the expected HL-LHC fluence and develop new irradiation models based on DLTS data and electrical measurements from irradiated test diodes.

Author

Yuzhan Zhao (Carleton University)

Co-authors

Callan Jessiman (Carleton University) Christoph Klein (Carleton University (CA)) Ezekiel Staats (Carleton University) Jeff Dandoy (Carleton University) John Keller (Carleton University) Miguel Ullan (Centro Nacional de Microelectronica (IMB-CNM, CSIC)) Thomas Koffas (Carleton University) Vitaly Fadeyev (University of California, Santa Cruz) Yoshinobu Unno (KEK)

Presentation materials

There are no materials yet.